Subatomic Features on the Silicon (111)-(7×7)

نویسنده

  • Franz J. Giessibl
چکیده

www.sciencemag.org (this information is current as of May 5, 2008 ): The following resources related to this article are available online at http://www.sciencemag.org/cgi/content/full/289/5478/422 version of this article at: including high-resolution figures, can be found in the online Updated information and services, http://www.sciencemag.org/cgi/content/full/289/5478/422#otherarticles , 1 of which can be accessed for free: cites 15 articles This article 85 article(s) on the ISI Web of Science. cited by This article has been http://www.sciencemag.org/cgi/content/full/289/5478/422#otherarticles 7 articles hosted by HighWire Press; see: cited by This article has been http://www.sciencemag.org/cgi/collection/mat_sci Materials Science : subject collections This article appears in the following http://www.sciencemag.org/about/permissions.dtl in whole or in part can be found at: this article permission to reproduce of this article or about obtaining reprints Information about obtaining

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force Microscopy.

The atomic force microscope images surfaces by sensing the forces between a sharp tip and a sample. If the tip-sample interaction is dominated by short-range forces due to the formation of covalent bonds, the image of an individual atom should reflect the angular symmetry of the interaction. Here, we report on a distinct substructure in the images of individual adatoms on silicon (111)-(7x7), t...

متن کامل

Imaging silicon by atomic force microscopy with crystallographically oriented tips

The images obtained by atomic force microscopy (AFM) originate from a convolution of atomic tip and sample states. Since the vertical resolution of AFM is approaching the picometer level, the atomic and subatomic structure of the tip is becoming increasingly important. Here, we demonstrate the preparation of crystallographically oriented AFM tips by breaking a silicon wafer along its preferenti...

متن کامل

The Effect of the Fractal Clusters on the Si (111)-7×7 Surface

one of the most important ingredients responsible for the success of integrated silicon technology is the Metal Oxide Semiconductor Field-Effect Transistor (MOSFET), and a major reason for its success is the MOSFET's scalability. Although the industry uses silicon and silicon dioxide in the electronic devices, it can be used for opto-electronic devices as well due to formation of fractal oxide ...

متن کامل

Modelling of ‘sub-atomic’ contrast resulting from back-bonding on Si(111)-7×7

It has recently been shown that 'sub-atomic' contrast can be observed during NC-AFM imaging of the Si(111)-7×7 substrate with a passivated tip, resulting in triangular shaped atoms [Sweetman et al. Nano Lett. 2014, 14, 2265]. The symmetry of the features, and the well-established nature of the dangling bond structure of the silicon adatom means that in this instance the contrast cannot arise fr...

متن کامل

Adsorption and Thermal Decomposition of Acetaldehyde on Si(111)-7×7

The thermal stability of acetaldehyde on Si(111)7×7 was studied with HREELS, XPS, UPS, and TPD techniques. Acetaldehyde molecules were found to adsorb molecularly on the surface at 120 K, yielding HREELS peaks at 98, 124, 144, 185, and 380 and UPS peaks at 5.7, 7.6, 10.0, and 13.9 eV below Ef. Analysis of the XPS O1s (shoulder at 531; 532 eV) and C1s (288 and 285 eV) spectra indicated that the ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2008